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    A design- for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults

    13 years 6 months ago
    A design- for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults
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    Fei Wang, Yu Hu, Huawei Li, Xiaowei Li
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    Added 12 Oct 2010
    Updated 12 Oct 2010
    Type Conference
    Year 2008
    Where ASPDAC
    Authors Fei Wang, Yu Hu, Huawei Li, Xiaowei Li
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