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High Defect Coverage with Low-Power Test Sequences in a BIST Environment

13 years 4 months ago

High Defect Coverage with Low-Power Test Sequences in a BIST Environment

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Patrick Girard, Christian Landrault, Serge Pravoss

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Added	18 Dec 2010
Updated	18 Dec 2010
Type	Journal
Year	2002
Where	DT
Authors	Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Hans-Joachim Wunderlich

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