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DAC
2004
ACM

Industrial experience with test generation languages for processor verification

13 years 9 months ago
Industrial experience with test generation languages for processor verification
Michael L. Behm, John M. Ludden, Yossi Lichtenstei
Added 30 Jun 2010
Updated 30 Jun 2010
Type Conference
Year 2004
Where DAC
Authors Michael L. Behm, John M. Ludden, Yossi Lichtenstein, Michal Rimon, Michael Vinov
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