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DAC
2004
ACM
13 years 10 months ago
Industrial experience with test generation languages for processor verification
Michael L. Behm, John M. Ludden, Yossi Lichtenstei...
MTV
2006
IEEE
98views Hardware» more  MTV 2006»
13 years 10 months ago
Directed Micro-architectural Test Generation for an Industrial Processor: A Case Study
Simulation-based validation of the current industrial processors typically use huge number of test programs generated at instruction set architecture (ISA) level. However, archite...
Heon-Mo Koo, Prabhat Mishra, Jayanta Bhadra, Magdy...
DATE
2000
IEEE
132views Hardware» more  DATE 2000»
13 years 9 months ago
Automatic Test Bench Generation for Validation of RT-Level Descriptions: An Industrial Experience
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
DAC
2005
ACM
13 years 6 months ago
VLIW: a case study of parallelism verification
Parallelism in processor architecture and design imposes a verification challenge as the exponential growth in the number of execution combinations becomes unwieldy. In this paper...
Allon Adir, Yaron Arbetman, Bella Dubrov, Yossi Li...
CODES
2008
IEEE
13 years 6 months ago
Specification-based compaction of directed tests for functional validation of pipelined processors
Functional validation is a major bottleneck in microprocessor design methodology. Simulation is the widely used method for functional validation using billions of random and biase...
Heon-Mo Koo, Prabhat Mishra