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DAC
2004
ACM

A new state assignment technique for testing and low power

9 years 4 months ago
A new state assignment technique for testing and low power
In order to improve the testabilities and power consumption, a new state assignment technique based on m-block partition is introduced in this paper. The length and number of feedback cycles are reduced with minimal switching activity on the state variables. Experiment shows significant improvement in power dissipation and testabilities for benchmark circuits. Categories and Subject Descriptors B.8.1 [Performance and Reliability]: Reliability, Testing and Fault-Tolerance. J.6 [Computer-Aided Engineering]: Computer-aided design (CAD) General Terms Algorithm, Logic Synthesis, Design. Keywords State Encoding, Fault Coverage, Low power, Scan design.
Sungju Park, Sangwook Cho, Seiyang Yang, Maciej J.
Added 30 Jun 2010
Updated 30 Jun 2010
Type Conference
Year 2004
Where DAC
Authors Sungju Park, Sangwook Cho, Seiyang Yang, Maciej J. Ciesielski
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