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2006
ACM

Post-routing redundant via insertion for yield/reliability improvement

10 years 2 months ago
Post-routing redundant via insertion for yield/reliability improvement
- Reducing the yield loss due to via failure is one of the important problems in design for manufacturability. A well known and highly recommended method to improve via yield/reliability is to add redundant vias. In this paper we study the problem of post-routing redundant via insertion and formulate it as a maximum independent set (MIS) problem. We present an efficient graph construction algorithm to model the problem, and an effective MIS heuristic to solve the problem. The experimental results show that our MIS heuristic inserts more redundant vias and distributes them more uniformly among via layers than a commercial tool and an existing method. The number of inserted redundant vias can be
Kuang-Yao Lee, Ting-Chi Wang
Added 13 Jun 2010
Updated 13 Jun 2010
Type Conference
Year 2006
Where ASPDAC
Authors Kuang-Yao Lee, Ting-Chi Wang
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