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DATE
2003
IEEE

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RTL Test Pattern Generation for High Quality Loosely Deterministic BIST

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RTL Test Pattern Generation for High Quality Loosely Deterministic BIST

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Marcelino B. Santos, José M. Fernandes, Isa

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DATE 2003 | Hardware |

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Added	04 Jul 2010
Updated	04 Jul 2010
Type	Conference
Year	2003
Where	DATE
Authors	Marcelino B. Santos, José M. Fernandes, Isabel C. Teixeira, João Paulo Teixeira

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