Memory state can be corrupted by the impact of particles causing single-event upsets (SEUs). Understanding and dealing with these soft (or transient) errors is important for syste...
Off-chip communication consumes a significant part of main memory system power. Existing solutions imply the use of specialized memories or assume error free environments. This i...
Sequential elements, flip-flops, latches, and memory cells, are the most vulnerable components to soft errors. Since state-of-the-art designs contain millions of bistables, it i...
This paper proposes a simulation-based soft error estimation methodology for computer systems. Accumulating soft error rates (SERs) of all memories in a computer system results in...
Errors in dynamic random access memory (DRAM) are a common form of hardware failure in modern compute clusters. Failures are costly both in terms of hardware replacement costs and...