465 search results - page 3 / 93 » A New Approach for Low Power Scan Testing |
ATS
2004
IEEE
13 years 9 months ago
2004
IEEE
Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce b...
ICCD
2004
IEEE
14 years 2 months ago
2004
IEEE
Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number ...
DATE
2008
IEEE
14 years 7 days ago
2008
IEEE
Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing...
DATE
2003
IEEE
13 years 11 months ago
2003
IEEE
We propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors...
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
Scan-based architectures, though widely used in modern designs, are expensive in power consumption. In this paper, we present a new technique that allows to design power-optimized...