4 search results - page 1 / 1 » A New Test Generation Approach for Embedded Analogue Cores i... |
ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
ATS
2003
IEEE
13 years 9 months ago
2003
IEEE
Software-based self-testing is a promising approach for the testing of processor cores which are embedded inside a System-on-a-Chip (SoC), as it can apply test vectors in function...
DFT
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...