This paper proposes a new clocking strategy for dynamic circuit. It provides faster performance and smaller area than conventional clocking scheme. The proposed clocking scheme fo...
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
Yanti Santoso, Matthew C. Merten, Elizabeth M. Rud...
— Clock power consumes a significant fraction of total power dissipation in high speed precharge/evaluate logic styles. In this paper, we present a novel low-cost design methodol...
In this paper we investigate activity-driven clock trees to reduce the dynamic power consumption of synchronous digital CMOS circuits. Sections of an activity-driven clock tree ca...
As integrated circuits are scaled down it becomes difficult to maintain uniformity in process parameters across each individual die. The resulting performance variation requires ...
N. Pete Sedcole, Justin S. Wong, Peter Y. K. Cheun...