3 search results - page 1 / 1 » A Novel Low Overhead Fault Tolerant Kogge-Stone Adder Using ... |
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
— As the feature size of transistors gets smaller, fabricating them becomes challenging. Manufacturing process follows various corrective design-for-manufacturing (DFM) steps to ...
ASPDAC
2008
ACM
13 years 7 months ago
2008
ACM
Meeting power and performance requirement is a challenging task in high speed ALUs. Supply voltage scaling is promising because it reduces both switching and active power but it al...
IOLTS
2005
IEEE
13 years 10 months ago
2005
IEEE
With the aggressive scaling of the CMOS technology parametric variation of the transistor threshold voltage causes significant spread in the circuit delay as well as leakage spect...