As current silicon-based techniques fast approach their practical limits, the investigation of nanoscale electronics, devices and system architectures becomes a central research p...
—Two probabilistic-based models, namely the Ensemble-Dependent Matrix model [1][3] and the Markov Random Field model [2], have been proposed to deal with faults in nanoscale syst...
Huifei Rao, Jie Chen, Changhong Yu, Woon Tiong Ang...
We propose a novel defect-tolerant design methodology using Bloom filters for defect mapping for nanoscale computing devices. It is a general approach that can be used for any pe...
This paper details nano-scale devices being researched by physical scientists to build computational systems. It also reviews some existing system design work that uses the device...
Michael T. Niemier, Ramprasad Ravichandran, Peter ...
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...