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ICCAD
2003
IEEE
127views Hardware» more  ICCAD 2003»
14 years 1 months ago
A Probabilistic-Based Design Methodology for Nanoscale Computation
As current silicon-based techniques fast approach their practical limits, the investigation of nanoscale electronics, devices and system architectures becomes a central research p...
R. Iris Bahar, Joseph L. Mundy, Jie Chen
ISCAS
2007
IEEE
106views Hardware» more  ISCAS 2007»
13 years 11 months ago
Ensemble Dependent Matrix Methodology for Probabilistic-Based Fault-tolerant Nanoscale Circuit Design
—Two probabilistic-based models, namely the Ensemble-Dependent Matrix model [1][3] and the Markov Random Field model [2], have been proposed to deal with faults in nanoscale syst...
Huifei Rao, Jie Chen, Changhong Yu, Woon Tiong Ang...
FCCM
2006
IEEE
106views VLSI» more  FCCM 2006»
13 years 11 months ago
Defect-Tolerant Nanocomputing Using Bloom Filters
We propose a novel defect-tolerant design methodology using Bloom filters for defect mapping for nanoscale computing devices. It is a general approach that can be used for any pe...
Gang Wang, Wenrui Gong, Ryan Kastner
ICCD
2004
IEEE
79views Hardware» more  ICCD 2004»
14 years 1 months ago
Using Circuits and Systems-Level Research to Drive Nanotechnology
This paper details nano-scale devices being researched by physical scientists to build computational systems. It also reviews some existing system design work that uses the device...
Michael T. Niemier, Ramprasad Ravichandran, Peter ...
GLVLSI
2006
IEEE
193views VLSI» more  GLVLSI 2006»
13 years 11 months ago
Optimizing noise-immune nanoscale circuits using principles of Markov random fields
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...