11 search results - page 1 / 3 » A Proposal for Routing-Based Timing-Driven Scan Chain Orderi... |
ISQED
2003
IEEE
13 years 10 months ago
2003
IEEE
Scan chain insertion can have large impact on routability, wirelength and timing. We propose a routing-driven and timing-aware methodology for scan insertion with minimum wireleng...
ASPDAC
2006
ACM
13 years 10 months ago
2006
ACM
Abstract— For scan-based testing, the high test power consumption may cause test power management problems, and the extra scan chain connections may cause routability degradation...
ICCD
2007
IEEE
14 years 1 months ago
2007
IEEE
Scan chains are widely used to improve the testability of IC designs. In traditional 2D IC designs, various design techniques on the construction of scan chains have been proposed...
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
It has been proven that scan path is a potent hazard for secure chips. Scan based attacks have been recently demonstrated against DES or AES and several solutions have been presen...
ATS
2004
IEEE
13 years 8 months ago
2004
IEEE
In this paper, we propose a low-power testing methodology for the scan-based BIST. A smoother is included in the test pattern generator (TPG) to reduce average power consumption d...