As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These “soft errors” can be a nuisance or catastro...
This paper concerns the validity of a widely used method for estimating the architecture-level mean time to failure (MTTF) due to soft errors. The method first calculates the fai...
Xiaodong Li, Sarita V. Adve, Pradip Bose, Jude A. ...
—Power and energy consumption has emerged as the premier and most constraining aspect in modern computational systems. Dynamic Voltage Scheduling (DVS) has been provably one of t...
— Lattice Reduction (LR) aided MIMO detection has been shown to provide near-optimal hard outputs. However soft outputs are required in practical systems to fully exploit gains f...
Vishakan Ponnampalam, Darren McNamara, Andy Lillie...
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...