28 search results - page 1 / 6 » A Unified Approach for SOC Testing Using Test Data Compressi... |
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
The testing time for a system-on-chip (SOC) is determined to a large extent by the design of test wrappers and the test access mechanism (TAM). Wrapper/TAM co-optimization is ther...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
We present a new approach for TAM optimization and test scheduling in the modular testing of mixed-signal SOCs. A test planning approach for digital SOCs is extended to handle ana...
ET
2002
13 years 4 months ago
2002
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...