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DFT
2007
IEEE
104views VLSI» more  DFT 2007»
14 years 3 days ago
Reduction of Fault Latency in Sequential Circuits by using Decomposition
The paper discusses a novel approach for reduction of fault detection latency in a selfchecking sequential circuit. The Authors propose decomposing the finite state machine (FSM) ...
Ilya Levin, Benjamin Abramov, Vladimir Ostrovsky
ATS
2003
IEEE
131views Hardware» more  ATS 2003»
13 years 11 months ago
Software-Based Delay Fault Testing of Processor Cores
Software-based self-testing is a promising approach for the testing of processor cores which are embedded inside a System-on-a-Chip (SoC), as it can apply test vectors in function...
Virendra Singh, Michiko Inoue, Kewal K. Saluja, Hi...
PADS
2006
ACM
13 years 11 months ago
Aurora: An Approach to High Throughput Parallel Simulation
A master/worker paradigm for executing large-scale parallel discrete event simulation programs over networkenabled computational resources is proposed and evaluated. In contrast t...
Alfred Park, Richard M. Fujimoto
VTS
1998
IEEE
97views Hardware» more  VTS 1998»
13 years 10 months ago
On the Identification of Optimal Cellular Automata for Built-In Self-Test of Sequential Circuits
This paper presents a BIST architecture for Finite State Machines that exploits Cellular Automata (CA) as pattern generators and signature analyzers. The main advantage of the pro...
Fulvio Corno, Nicola Gaudenzi, Paolo Prinetto, Mat...
CSREAESA
2008
13 years 7 months ago
BIST-BASED Group Testing for Diagnosis of Embedded FPGA Cores
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
Alireza Sarvi, Carthik A. Sharma, Ronald F. DeMara