54 search results - page 3 / 11 » A new state assignment technique for testing and low power |
DAC
2009
ACM
14 years 15 hour ago
2009
ACM
In this work, we present a new optical routing framework, O-Router for future low-power on-chip optical interconnect integration utilizing silicon compatible nano-photonic devices...
DAC
2009
ACM
14 years 6 months ago
2009
ACM
In this work, we present a new optical routing framework, O-Router for future low-power on-chip optical interconnect integration utilizing silicon compatible nano-photonic devices...
DFT
2005
IEEE
13 years 7 months ago
2005
IEEE
A built-in self-test (BIST) scheme is presented which both reduces overhead for detecting random-pattern-resistant (r.p.r.) faults as well as reduces power consumption during test...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
CASES
2003
ACM
13 years 10 months ago
2003
ACM
Reducing the power consumption of computing devices has gained a lot of attention recently. Many research works have focused on reducing power consumption in the off-chip buses as...