1175 search results - page 1 / 235 » A scalable method for the generation of small test sets |
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
This paper presents a scalable method to generate close to minimal size test pattern sets for stuck-at faults in scan based circuits. The method creates sets of potentially compat...
ET
1998
13 years 4 months ago
1998
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
QSIC
2003
IEEE
13 years 10 months ago
2003
IEEE
In this paper, we consider a problem that arises in black box testing: generating small test suites (i.e., sets of test cases) where the combinations that have to be covered are s...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...