13 search results - page 2 / 3 » A unified non-rectangular device and circuit simulation mode... |
ASPDAC
2010
ACM
13 years 3 months ago
2010
ACM
- Dynamic power consumption in CMOS circuits is usually estimated based on the number of signal transitions. However, when considering glitches, this is not accurate because narrow...
ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...
QEST
2010
IEEE
13 years 3 months ago
2010
IEEE
Traditional architecture design approaches hide hardware uncertainties from the software stack through overdesign, which is often expensive in terms of power consumption. The recen...
TVLSI
2010
12 years 12 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...