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    ASPDAC
    2009
    ACM
    164views Hardware» more  ASPDAC 2009»
    Accounting for non-linear dependence using function driven component analysis
    13 years 11 months ago
    Accounting for non-linear dependence using function driven component analysis
    Download  eda.ee.ucla.edu
    Majority of practical multivariate statistical analyses and optimizations model interdependence among random variables in terms of the linear correlation among them. Though linear...
    Lerong Cheng, Puneet Gupta, Lei He
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    VLSID
    2007
    IEEE
    149views VLSI» more  VLSID 2007»
    Efficient and Accurate Statistical Timing Analysis for Non-Linear Non-Gaussian Variability With Incremental Attributes
    14 years 5 months ago
    Efficient and Accurate Statistical Timing Analysis for Non-Linear Non-Gaussian Variability With Incremental Attributes
    Download  www.lib.umd.edu
    Title of thesis: EFFICIENT AND ACCURATE STATISTICAL TIMING ANALYSIS FOR NON-LINEAR NON-GAUSSIAN VARIABILITY WITH INCREMENTAL ATTRIBUTES Ashish Dobhal, Master of Science, 2006 Thes...
    Ashish Dobhal, Vishal Khandelwal, Ankur Srivastava
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    PDP
    1996
    IEEE
    130views Distributed And Parallel Com...» more  PDP 1996»
    Application-Dependent Performability Evaluation of Fault-Tolerant Multiprocessors
    13 years 9 months ago
    Application-Dependent Performability Evaluation of Fault-Tolerant Multiprocessors
    Download  www3.informatik.uni-erlangen.de
    A case study of performance and dependability evaluation of fault-tolerant multiprocessors is presented. Two specific architectures are analyzed taking into account system functio...
    Stefan Dalibor, A. Hein, Wolfgang Hohl
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    GLVLSI
    2007
    IEEE
    194views VLSI» more  GLVLSI 2007»
    Probabilistic maximum error modeling for unreliable logic circuits
    13 years 9 months ago
    Probabilistic maximum error modeling for unreliable logic circuits
    Download  www.eng.usf.edu
    Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
    Karthikeyan Lingasubramanian, Sanjukta Bhanja
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