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DATE
2007
IEEE
134views Hardware» more  DATE 2007»
13 years 11 months ago
Accurate temperature-dependent integrated circuit leakage power estimation is easy
— It has been the conventional assumption that, due to the superlinear dependence of leakage power consumption on temperature, and widely varying on-chip temperature profiles, a...
Yongpan Liu, Robert P. Dick, Li Shang, Huazhong Ya...
DAC
2004
ACM
13 years 10 months ago
Parametric yield estimation considering leakage variability
Leakage current has become a stringent constraint in today’s processor designs in addition to traditional constraints on frequency. Since leakage current exhibits a strong inver...
Rajeev R. Rao, Anirudh Devgan, David Blaauw, Denni...
TVLSI
2010
12 years 11 months ago
Variation-Aware System-Level Power Analysis
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
Saumya Chandra, Kanishka Lahiri, Anand Raghunathan...
ISLPED
2006
ACM
83views Hardware» more  ISLPED 2006»
13 years 10 months ago
Considering process variations during system-level power analysis
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
Saumya Chandra, Kanishka Lahiri, Anand Raghunathan...
TVLSI
2008
139views more  TVLSI 2008»
13 years 4 months ago
Ternary CAM Power and Delay Model: Extensions and Uses
Applications in computer networks often require high throughput access to large data structures for lookup and classification. While advanced algorithms exist to speed these search...
Banit Agrawal, Timothy Sherwood