26 search results - page 1 / 6 » Adaptive Diagnostic Pattern Generation for Scan Chains |
13
Voted
DELTA
2008
IEEE
13 years 11 months ago
2008
IEEE
Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, ...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
—In the past, software based scan chain defect diagnosis can be roughly classified into two categories (1) model-based algorithms, and (2) data-driven algorithms. In this paper w...
DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...