137 search results - page 2 / 28 » Adaptive Techniques for Improving Delay Fault Diagnosis |
ICCBR
2003
Springer
13 years 10 months ago
2003
Springer
Abstract. There have been some Artificial Intelligence applications developed for electronic circuits diagnosis, but much remains to be done in this field, above all in the analo...
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the ...
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
DELTA
2008
IEEE
13 years 11 months ago
2008
IEEE
Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, ...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
A deterministic partitioning technique for fault diagnosis in Scan-Based BIST is proposed. Properties of high quality partitions for improved fault diagnosis times are identified...