29 search results - page 1 / 6 » An Area Efficient Mixed-Signal Test Architecture for Systems... |
VLSID
2006
IEEE
14 years 5 months ago
2006
IEEE
ET
2006
13 years 5 months ago
2006
We present an efficient built-in self-test (BIST) architecture for testing and diagnosing stuck-at faults, delay faults, and bridging faults in FPGA interconnect resources. The BIS...
ATS
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
ECBS
2010
IEEE
13 years 3 months ago
2010
IEEE
Software development and testing of Enterprise Resource Planning (ERP) systems demands dedicated methods to tackle its special features. As manual testing is not able to systematic...
FCCM
2006
IEEE
13 years 9 months ago
2006
IEEE
The Apriori algorithm is a fundamental correlation-based data mining kernel used in a variety of fields. The innovation in this paper is a highly parallel custom architecture impl...