4 search results - page 1 / 1 » An algorithm to minimize leakage through simultaneous input ... |
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
DAC
2004
ACM
13 years 8 months ago
2004
ACM
In a CMOS combinational logic circuit, the subthreshold leakage current in the standby state depends on the state of the inputs. In this paper we present a new approach to identif...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
—1As technology scales, the aging effect caused by Negative Bias Temperature Instability (NBTI) has become a major reliability concern for circuit designers. On the other hand, r...
DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...