45 search results - page 3 / 9 » An efficient static algorithm for computing the soft error r... |
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and atmospheric neutron strikes as device scaling reduces node capacitances and suppl...
DAC
1998
ACM
13 years 9 months ago
1998
ACM
This papers describes a new, fast and economical methodology to test linear analog circuits based on adaptive algorithms. To the authors knowledge, this is the first time such tec...
DAC
2005
ACM
13 years 7 months ago
2005
ACM
In this paper, we propose a new sensitivity based, statistical gate sizing method. Since circuit optimization effects the entire shape of the circuit delay distribution, it is dif...
DAC
2009
ACM
14 years 6 months ago
2009
ACM
State elements are increasingly vulnerable to soft errors due to their decreasing size, and the fact that latched errors cannot be completely eliminated by electrical or timing ma...
ET
2002
13 years 5 months ago
2002
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...