115 search results - page 22 / 23 » Analysis and optimization of gate leakage current of power g... |
ICCAD
2003
IEEE
14 years 2 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
ICCAD
2006
IEEE
14 years 2 months ago
2006
IEEE
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
ICCD
2007
IEEE
14 years 2 months ago
2007
IEEE
This paper proposes an efficient analysis flow and an algorithm to identify the worst case noise for power networks with multiple clock domains. First, we apply the Laplace transf...
ISPD
2010
ACM
14 years 7 days ago
2010
ACM
As the thermal wall becomes the dominant factor limiting VLSI circuit performance, and the interconnect wires become the primary power consumer, power efficiency of onchip data th...
ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...