10 search results - page 2 / 2 » Analyzing Soft Errors in Leakage Optimized SRAM Design |
TCAD
2008
13 years 5 months ago
2008
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
HPCA
2009
IEEE
14 years 11 days ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Phase change memory (PCM) is one of the most promising technology among emerging non-volatile random access memory technologies. Implementing a cache memory using PCM provides m...
CHES
2003
Springer
13 years 10 months ago
2003
Springer
We introduce multi-channel attacks, i.e., side-channel attacks which utilize multiple side-channels such as power and EM simultaneously. We propose an adversarial model which combi...