7 search results - page 1 / 2 » Application-Aware diagnosis of runtime hardware faults |
ICCAD
2010
IEEE
13 years 2 months ago
2010
IEEE
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
ICCD
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only re...
DSN
2008
IEEE
13 years 11 months ago
2008
IEEE
In the near future, hardware is expected to become increasingly vulnerable to faults due to continuously decreasing feature size. Software-level symptoms have previously been used...
ROBOCUP
2005
Springer
13 years 10 months ago
2005
Springer
Faults in hardware and software are not totally avoidable not even if the components are carefully designed, implemented and tested. In this paper we present a solution for detecti...
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
In this paper, we identify two main bottlenecks in the functional diagnosis flow and propose new ways to overcome these. Our approach completely eliminates the “Primary Input (P...