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» Assessing chip-level impact of double patterning lithography
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ISQED
2010
IEEE
141views Hardware» more  ISQED 2010»
13 years 11 months ago
Assessing chip-level impact of double patterning lithography
—Double patterning lithography (DPL) provides an attractive alternative or a supplementary method to enable the 32nm and 22nm process nodes, relative to costlier technology optio...
Kwangok Jeong, Andrew B. Kahng, Rasit Onur Topalog...
ASPDAC
2009
ACM
212views Hardware» more  ASPDAC 2009»
13 years 11 months ago
Timing analysis and optimization implications of bimodal CD distribution in double patterning lithography
Abstract— Double patterning lithography (DPL) is in current production for memory products, and is widely viewed as inevitable for logic products at the 32nm node. DPL decomposes...
Kwangok Jeong, Andrew B. Kahng
ICCAD
2009
IEEE
151views Hardware» more  ICCAD 2009»
13 years 2 months ago
Timing yield-aware color reassignment and detailed placement perturbation for double patterning lithography
Double patterning lithography (DPL) is a likely resolution enhancement technique for IC production in 32nm and below technology nodes. However, DPL gives rise to two independent, ...
Mohit Gupta, Kwangok Jeong, Andrew B. Kahng
SLIP
2009
ACM
13 years 11 months ago
Is overlay error more important than interconnect variations in double patterning?
Double patterning lithography seems to be a prominent choice for 32nm and 22nm technologies. Double patterning lithography techniques require additional masks for a single interco...
Kwangok Jeong, Andrew B. Kahng, Rasit Onur Topalog...
ASPDAC
2010
ACM
637views Hardware» more  ASPDAC 2010»
13 years 2 months ago
A new graph-theoretic, multi-objective layout decomposition framework for double patterning lithography
As Double Patterning Lithography(DPL) becomes the leading candidate for sub-30nm lithography process, we need a fast and lithography friendly decomposition framework. In this pape...
Jae-Seok Yang, Katrina Lu, Minsik Cho, Kun Yuan, D...