27 search results - page 1 / 6 » Asynchronous circuits transient faults sensitivity evaluatio... |
DAC
2005
ACM
13 years 6 months ago
2005
ACM
1 This paper presents a transient faults sensitivity evaluation for Quasi Delay Insensitive (QDI) asynchronous circuits. Because of their specific architecture, asynchronous circui...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Very deep submicron and nanometer technologies have increased notably integrated circuit (IC) sensitiveness to radiation. Soft errors are currently appearing into ICs working at e...
DFT
2003
IEEE
13 years 10 months ago
2003
IEEE
Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...
DSD
2007
IEEE
13 years 11 months ago
2007
IEEE
With continuing increase in soft error rates, its foreseeable that multiple faults will eventually need to be considered when modeling circuit sensitivity and evaluating faulttole...
ICCAD
1998
IEEE
13 years 8 months ago
1998
IEEE
This paper presents a novel concurrent fault simulator (called CONCERT) for nonlinear analog circuits. Three primary techniques in CONCERT, including fault ordering, state predict...