106 search results - page 2 / 22 » Automated data analysis solutions to silicon debug |
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
When searching for functional bugs in silicon, debug data is acquired after a trigger event occurs. A trigger event can be configured at run-time using a set of control registers...
DAC
2009
ACM
14 years 5 months ago
2009
ACM
Post-silicon validation has become an essential step in the design flow of today's complex integrated circuits. One effective technique that provides real-time visibility to ...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Today’s complex integrated circuit designs increasingly rely on post-silicon validation to eliminate bugs that escape from presilicon verification. One effective silicon debug ...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...