17 search results - page 1 / 4 » Automatic Test Program Generation from RT-Level Microprocess... |
ISQED
2002
IEEE
13 years 9 months ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
DAC
2005
ACM
14 years 5 months ago
2005
ACM
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Interrupt behaviors, especially the external ones, are difficult to verify in a microprocessor design project in that they involve both interacting hardware and software. This pap...
DATE
2004
IEEE
13 years 8 months ago
2004
IEEE
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
CPE
1994
Springer
13 years 9 months ago
1994
Springer
When implementingparallel programs forparallel computer systems the performancescalability of these programs should be tested and analyzed on different computer configurations and...