90 search results - page 2 / 18 » Automatic generation of synthetic sequential benchmark circu... |
VTS
1996
IEEE
13 years 9 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
DAC
1995
ACM
13 years 9 months ago
1995
ACM
Our goal is to transform a low-level circuit design into a more representation. A pre-existing tool, Tranalyze [4], takes a switch-level circuit and generates a functionally equiv...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
ISLPED
1997
ACM
13 years 9 months ago
1997
ACM
A new statistical technique for average power estimation in sequential circuits is presented. Due to the feedback mechanism, conventional statistical procedures cannot be applied ...