12 search results - page 1 / 3 » Automating post-silicon debugging and repair |
ATS
2010
IEEE
13 years 2 months ago
2010
IEEE
One of the most challenging problems in post-silicon validation is to identify those errors that cause prohibitive extra delay on speedpaths in the circuit under debug (CUD) and o...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
When searching for functional bugs in silicon, debug data is acquired after a trigger event occurs. A trigger event can be configured at run-time using a set of control registers...
ICCAD
2007
IEEE
14 years 1 months ago
2007
IEEE
Modern IC designs have reached unparalleled levels of complexity, resulting in more and more bugs discovered after design tape-out However, so far only very few EDA tools for post...
KBSE
2009
IEEE
13 years 11 months ago
2009
IEEE
—Automated debugging is becoming increasingly important as the size and complexity of software increases. This paper makes a case for using constraint-based data structure repair...
DAC
2009
ACM
14 years 5 months ago
2009
ACM
Post-silicon validation has become an essential step in the design flow of today's complex integrated circuits. One effective technique that provides real-time visibility to ...