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ICCAD
2007
IEEE
116views Hardware» more  ICCAD 2007»
14 years 2 months ago
Device and architecture concurrent optimization for FPGA transient soft error rate
Late CMOS scaling reduces device reliability, and existing work has studied the permanent SER (soft error rate) for configuration memory in FPGA extensively. In this paper, we sh...
Yan Lin, Lei He
HPCA
2009
IEEE
14 years 2 days ago
Soft error vulnerability aware process variation mitigation
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
Xin Fu, Tao Li, José A. B. Fortes
DAC
2005
ACM
14 years 6 months ago
Device and architecture co-optimization for FPGA power reduction
Device optimization considering supply voltage Vdd and threshold voltage Vt tuning does not increase chip area but has a great impact on power and performance in the nanometer tec...
Lerong Cheng, Phoebe Wong, Fei Li, Yan Lin, Lei He
DAC
2005
ACM
14 years 6 months ago
Race-condition-aware clock skew scheduling
The race conditions often limit the smallest feasible clock period that the optimal clock skew scheduling can achieve. Therefore, the combination of clock skew scheduling and dela...
Shih-Hsu Huang, Yow-Tyng Nieh, Feng-Pin Lu
TON
2010
152views more  TON 2010»
13 years 3 months ago
1 + N network protection for mesh networks: network coding-based protection using p-cycles
—p-Cycles have been proposed for preprovisioned 1 : N protection in optical mesh networks. Although the protection circuits are preconfigured, the detection of failures and the ...
Ahmed E. Kamal