Late CMOS scaling reduces device reliability, and existing work has studied the permanent SER (soft error rate) for configuration memory in FPGA extensively. In this paper, we sh...
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
Device optimization considering supply voltage Vdd and threshold voltage Vt tuning does not increase chip area but has a great impact on power and performance in the nanometer tec...
Lerong Cheng, Phoebe Wong, Fei Li, Yan Lin, Lei He
The race conditions often limit the smallest feasible clock period that the optimal clock skew scheduling can achieve. Therefore, the combination of clock skew scheduling and dela...
—p-Cycles have been proposed for preprovisioned 1 : N protection in optical mesh networks. Although the protection circuits are preconfigured, the detection of failures and the ...