13 search results - page 1 / 3 » Body Bias Voltage Computations for Process and Temperature C... |
TVLSI
2008
13 years 4 months ago
2008
With continued scaling into the sub-90nm regime, the role of process, voltage and temperature (PVT) variations on the performance of VLSI circuits has become extremely important. T...
ASPDAC
2006
ACM
13 years 10 months ago
2006
ACM
— Process variations and temperature variations can cause both the frequency and the leakage of the chip to vary significantly from their expected values, thereby decreasing the...
ASPDAC
2009
ACM
13 years 11 months ago
2009
ACM
— Negative Bias Temperature Instability (NBTI) is a leading reliability concern for integrated circuits (ICs). It gradually increases the threshold voltages of PMOS transistors, ...
DAC
2004
ACM
14 years 5 months ago
2004
ACM
We investigate trade-offs in microprocessor frequency and system power achievable for low temperature operation in scaled high leakage technologies by combining refrigeration with...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
Abstract— Dynamic voltage scaling (DVS) is a powerful technique for reducing dynamic power consumption in a computing system. However, as technology feature size continues to sca...