With continued scaling into the sub-90nm regime, the role of process, voltage and temperature (PVT) variations on the performance of VLSI circuits has become extremely important. T...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
— Process variations and temperature variations can cause both the frequency and the leakage of the chip to vary significantly from their expected values, thereby decreasing the...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
— Negative Bias Temperature Instability (NBTI) is a leading reliability concern for integrated circuits (ICs). It gradually increases the threshold voltages of PMOS transistors, ...
We investigate trade-offs in microprocessor frequency and system power achievable for low temperature operation in scaled high leakage technologies by combining refrigeration with...
Arman Vassighi, Ali Keshavarzi, Siva Narendra, Ger...
Abstract— Dynamic voltage scaling (DVS) is a powerful technique for reducing dynamic power consumption in a computing system. However, as technology feature size continues to sca...