13 search results - page 3 / 3 » Body Bias Voltage Computations for Process and Temperature C... |
VLSID
2005
IEEE
14 years 6 months ago
2005
IEEE
One of the main challenges for design in the presence of process variations is to cope with the uncertainties in delay and leakage power. In this paper, the influence of leakage r...
HPCA
2009
IEEE
14 years 17 days ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
CASES
2006
ACM
13 years 11 months ago
2006
ACM
Rising interest in the applications of wireless sensor networks has spurred research in the development of computing systems for lowthroughput, energy-constrained applications. Un...