9 search results - page 1 / 2 » Built-in self-test of FPGA interconnect |
DFT
2009
IEEE
14 years 19 hour ago
2009
IEEE
This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate Arrays (FPGAs) using a soft core embedded processor for reconfiguration of the...
CSREAESA
2009
13 years 6 months ago
2009
A Built-In Self-Test (BIST) approach is presented for the Internal Configuration Access Port (ICAP) and Frame Error Correcting Code (ECC) logic cores embedded in Xilinx Virtex-4 an...
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
: We present a Built-In Self-Test (BIST)-based diagnostic approach for the programmable interconnect resources in Field Programmable Gate Arrays (FPGAs) that can be used for either...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Abstract: We discuss the development of Built-In SelfTest (BIST) configurations that test all of the programmable logic and interconnect resources in the core of Xilinx 4000E, 4000...
CSREAESA
2009
13 years 6 months ago
2009
Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip...