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VLSID
2009
IEEE
119views VLSI» more  VLSID 2009»
14 years 5 months ago
Single Ended Static Random Access Memory for Low-Vdd, High-Speed Embedded Systems
Abstract-- Single-ended static random access memory (SESRAM) is well known for their tremendous potential of low active power and leakage dissipations. In this paper, we present a ...
Jawar Singh, Jimson Mathew, Saraju P. Mohanty, Dhi...
IOLTS
2005
IEEE
141views Hardware» more  IOLTS 2005»
13 years 10 months ago
A Novel On-Chip Delay Measurement Hardware for Efficient Speed-Binning
With the aggressive scaling of the CMOS technology parametric variation of the transistor threshold voltage causes significant spread in the circuit delay as well as leakage spect...
Arijit Raychowdhury, Swaroop Ghosh, Kaushik Roy
ET
2002
122views more  ET 2002»
13 years 4 months ago
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
Magnus Eckersand, Fredrik Franzon, Ken Filliter