43 search results - page 1 / 9 » Capacitive Leadframe Testing |
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
Capacitive Leadframe testing is an effective approach for detecting faults in printed circuit boards. Capacitance measurements, however, are affected by mechanical variations duri...
ISCAS
2005
IEEE
13 years 11 months ago
2005
IEEE
— We describe a CMOS capacitance sensor for measuring the capacitive coupling between living cells and the underlying substrate, a quantity that can be used to characterize cell ...
ATS
2003
IEEE
13 years 11 months ago
2003
IEEE
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
3DIC
2009
IEEE
14 years 12 days ago
2009
IEEE
—A high-sensitivity capacitive-coupling interface is presented for wireless wafer testing systems. The transmitter is a buffer that drives the transmitter pad, and the receiver c...
DAC
2000
ACM
14 years 6 months ago
2000
ACM
We revisit a basic element of modern signal integrity analysis, the modeling of worst-case coupling capacitance effects within a switch factor (SF) based methodology. We show that...