7 search results - page 2 / 2 » Causal probabilistic input dependency learning for switching... |
GLVLSI
2007
IEEE
13 years 9 months ago
2007
IEEE
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
GLVLSI
1998
IEEE
13 years 9 months ago
1998
IEEE
In this research, we devised a new simple technique for statically holding analog weights, which does not require periodic refreshing. It further contains a mechanism to locally u...