13 search results - page 1 / 3 » Characterization of CMOS Defects using Transient Signal Anal... |
DFT
1998
IEEE
13 years 9 months ago
1998
IEEE
We present the results of hardware experiments designed to determine the relative contribution of CMOS coupling mechanisms to off-path signal variations caused by common types of ...
ITC
1996
IEEE
13 years 9 months ago
1996
IEEE
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points and on IDD switching transients on the sup...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
ICCAD
2003
IEEE
14 years 2 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...