14 search results - page 2 / 3 » Concurrent Error Detection in Self-Timed VLSI |
CHES
2004
Springer
13 years 10 months ago
2004
Springer
Because of the rapidly shrinking dimensions in VLSI, transient and permanent faults arise and will continue to occur in the near future in increasing numbers. Since cryptographic c...
DFT
2002
IEEE
13 years 10 months ago
2002
IEEE
A novel approach for reducing power consumption in checkers used for concurrent error detection is presented. Spatial correlations between the outputs of the circuit that drives t...
DFT
2008
IEEE
13 years 11 months ago
2008
IEEE
The paper presents a new technique for designing a concurrently checking combinational circuit. The technique is based on partitioning the circuit into two independent sub-circuit...
VLSID
2003
IEEE
14 years 5 months ago
2003
IEEE
We propose a non-intrusive methodology for concurrent fault detection in FSMs. The proposed method is similar to duplication, wherein a replica of the circuit acts as a predictor ...
DFT
2003
IEEE
13 years 10 months ago
2003
IEEE
We describe a method for designing fault tolerant circuits based on an extension of a Concurrent Error Detection (CED) technique. The proposed extension combines parity check code...