10 search results - page 1 / 2 » Confidence Scalable Post-Silicon Statistical Delay Predictio... |
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
DAC
2010
ACM
13 years 8 months ago
2010
ACM
The identification of speedpaths is required for post-silicon (PS) timing validation, and it is currently becoming timeconsuming due to manufacturing variations. In this paper we...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
A physical yet compact gate delay model is developed integrating short-channel effects and the Alpha-power law based timing model. This analytical approach accurately predicts bot...
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
DAC
2008
ACM
14 years 5 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...