10 search results - page 1 / 2 » Confidence Scalable Post-Silicon Statistical Delay Predictio... |
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
DAC
2010
ACM
13 years 8 months ago
2010
ACM
The identification of speedpaths is required for post-silicon (PS) timing validation, and it is currently becoming timeconsuming due to manufacturing variations. In this paper we...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
A physical yet compact gate delay model is developed integrating short-channel effects and the Alpha-power law based timing model. This analytical approach accurately predicts bot...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
DAC
2008
ACM
14 years 5 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...