4 search results - page 1 / 1 » Constraint extraction for pseudo-functional scan-based delay... |
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...
ASPDAC
2005
ACM
13 years 7 months ago
2005
ACM
Recent research results have shown that the traditional structural testing for delay and crosstalk faults may result in over-testing due to the non-trivial number of such faults t...
ATS
2003
IEEE
13 years 10 months ago
2003
IEEE
Software-based self-testing is a promising approach for the testing of processor cores which are embedded inside a System-on-a-Chip (SoC), as it can apply test vectors in function...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
When testing delay faults on critical paths, conventional structural test patterns may be applied in functionally-unreachable states, leading to over-testing or under-testing of t...