31 search results - page 1 / 7 » Controllability-driven Power Virus Generation for Digital Ci... |
VLSID
2007
IEEE
14 years 5 months ago
2007
IEEE
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The Power Virus problem involves...
DAC
2000
ACM
14 years 5 months ago
2000
ACM
Substrate noise caused by large digital circuits will degrade the performance of analog circuits located on the same substrate. To simulate this performance degradation, the total...
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
Nanometer circuits are highly susceptible to soft errors generated by alpha-particle or atmospheric neutron strikes to circuit nodes. The reasons for the high susceptibility are t...
CASES
2006
ACM
13 years 10 months ago
2006
ACM
Rising interest in the applications of wireless sensor networks has spurred research in the development of computing systems for lowthroughput, energy-constrained applications. Un...
DAC
1994
ACM
13 years 9 months ago
1994
ACM
Higher levels of integration have led to a generation of integrated circuits for which power dissipation and reliability are major design concerns. In CMOS circuits, both of these ...