29 search results - page 2 / 6 » Convolutional Compaction of Test Responses |
DAC
2005
ACM
13 years 7 months ago
2005
ACM
This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant respo...
DAC
2006
ACM
14 years 6 months ago
2006
ACM
For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. ali...
ICCAD
2007
IEEE
14 years 2 months ago
2007
IEEE
This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature R...
ICCAD
2003
IEEE
13 years 10 months ago
2003
IEEE
The design of a test response compactor called a Block Compactor is given. Block Compactors belong to a new class of compactors called Finite Memory Compactors. Different from spa...
DATE
2009
IEEE
14 years 1 days ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...